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Franz Josef Gießibl ( * May 27, 1962 in Amerang) is a German physicist and university professor at the University of Regensburg. Currently, he is a visiting fellow at National Institute of Standards and Technology and a visting professor at University of Maryland, College Park. == Life == Giessibl studied physics from 1982 to 1987 at the Technical University of Munich and at Eidgenössische Technischen Hochschule Zürich. He received a diploma in experimental physics in 1988 with Professor Gerhard Abstreiter and continued with a PhD in physics with Nobel Laureate Gerd Binnig at the IBM Physics Group Munich on atomic force microscopy. After working as a senior associate with McKinsey & Company from 1995 to 1996, he continued to do research on the atomic force microscope and joined Professor Jochen Mannhart at University of Augsburg, where he received a habilitation in 2001. In 2006, he joined the faculty at the Department of Physics at the University of Regensburg in Germany.〔(Website Franz Josef Gießibl (Uni Regensburg) )〕 Giessibl is a pioneer of atomic force microscopy,〔(SPIEGEL ONLINE - Wissenschaft - 27. Juli 2000: Nanophysik: Atome unterm Mikroskop )〕〔(DIE WELT: 24. Januar 2003: Nanophysiker Franz Giessibl hantiert mit Apfelsinen )〕〔(The New York Times - 22. Februar 2008: Scientists Measure What It Takes to Push a Single Atom )〕 who published papers on experimental〔F. J. Giessibl: ''Atomic resolution of the Silicon (111)-(7x7) surface by atomic force microscopy.'' ''Science'' 267, Nr. 5194, 1995, p. 68–71.〕〔F. J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart: ''Subatomic features on the Silicon (111)-(7x7) surface observed by atomic force microscopy.'' In: ''Science.'' 289, Nr. 5478, 2000, p. 422-425.〕 and theoretical aspects〔F. J. Giessibl: ''Forces and frequency shifts in atomic-resolution dynamic-force microscopy.'' ''Phys. Rev. B'' 56, 1997, p. 16010–16015.〕〔F. J. Giessibl: ''Advances in atomic force microscopy.'' In: ''Reviews of Modern Physics.'' 75, Nr. 3, 2003, p. 949–983〕〔F. J. Giessibl, F. Pielmeier, T. Eguchi, T. An, Y. Hasegawa: ''Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators.'' ''Phys. Rev. B'' 84, 2011, article number 125409, 15 pages.〕 of atomic force microscopy. Giessibl is the inventor of the qPlus sensor,〔F. J. Giessibl: ''Device for noncontact intermittent contact scanning of a surface and a process therefore.'' US Patent 6240771〕〔F. J. Giessibl: ''Sensor for noncontact profiling of a surface.'' US Patent 8393009〕 a sensor for Non-contact atomic force microscopy that relies on a quartz cantilever. His invention has enabled atomic force microscopy to obtain subatomic spatial resolution on individual atoms and submolecular resolution on organic molecules. Today, the qPlus sensor is used in many commercial and homebuilt atomic force microscopes. From 2005 until 2010, he spent about 4 months at IBM Almaden Research Center to work on low-temperature atomic force microscopy. Some of Giessibls experimental images were the basis for the offset print editions ''Erster Blick'' (2000) and ''Graphit'' (2004) by visual artist Gerhard Richter. 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Franz Josef Giessibl」の詳細全文を読む スポンサード リンク
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